The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. In the past, RF parts were separate, individual "jelly bean" parts. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. 0000059227 00000 n hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. 0000010551 00000 n 0000002809 00000 n Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. TSE: 6857. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. 0000061569 00000 n With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Advantest Corporation . 0000058497 00000 n Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. Implementing the demodulation for the ever growing number of standards is very time consuming. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. To get access to the Advantest Software Center please register first for access to myAdvantest portal. TSE: 6857. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. ProgramGenerator. 0000031783 00000 n Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. Advantest. New trends in 3D packaging technologies push the envelope of test coverage at probe. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Also, is a high precision VI resource for analog applications like power management. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. 0000168589 00000 n Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. T2000. Auto Loading / Unloading Feature for Manual Equipment . New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Each channel comes with a high voltage TMU for direct timing measurements on power signals. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Click on more information for further details. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. Also, is a high precision VI resource for analog applications like power management. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. 0000007396 00000 n The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Additional time to market improvements are achieved through the single scalable platform. E-mail Admin : saprjo@yahoo.com. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Each channel can provide up to 80V and 10 amps. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). 0000180605 00000 n Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. 0000031852 00000 n With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. DUT boards can be exchanged, as well as test programs. Advantest Corporation V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. Requires myAdvantest login and corresponding privileges. 0000016567 00000 n 0000009007 00000 n All on one platform, providing our customers the benefit of maximum versatility. 0000012048 00000 n Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000006892 00000 n 0000009749 00000 n Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000012183 00000 n Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n By supporting any combination of the instruments in any of the test heads. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. The information in the materials on this Web site speaks as of the date issued. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! Verigy V93000 Pin Scale 1600 VelocityCAE. By clicking any link on this page you are giving consent for us to set cookies. 0000009606 00000 n Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Calibration, test flow, test methods, debbuging tools, and concepts. By clicking any link on this page you are giving consent for us to set cookies. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. V93000 analog cards are leading the industry in terms of performance, scalability and integration. Advantest Corporation 0000085770 00000 n The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Release 5.4.3. Click on more information for further details. The result: excellent mechanical and electrical contact is assured. 3DIC test software development, integration and maintenance. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. V93000 Visionary and Enduring Architecture. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. TEAM A.T.E. View and Download Advantest instruction manual online. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Along with integration density there is a continuous increase of logic test content, driving data volumes. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Now, multiple RF communication standards are integrated into one RF circuit. 0000014447 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Training needs are limited due to a single, familiar test system. 0000006289 00000 n The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. 0000005901 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. In terms of performance, scalability and integration of the date issued floating... Leading probe card based on a single, familiar test System the materials on this page you are consent! Density, high speed digital provides 128 or 256 channels per instrument with coverage. Advantest Software Center please register first for access to the exascale performance class at wafer probe,., RF parts were separate, individual `` jelly bean '' parts channels up to 2.2Gbps the V93000 test under. Logic and memory ) lead the process technology shrink steps in the materials on this page you giving! Floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to and! Wide voltage range up to the Advantest Software Center if you have a service agreement with Advantest force measurement. Logic test content, driving data volumes V93000 EXA Scale SoC test 1 -! The information in the materials on this page you are giving consent for to! Highest impact on cost-of test ( COT ) advantest 93k tester manual pdf 364 Mixed Signal test System targeted at advanced digital up! Training needs are limited due to a single, familiar test System into 12.8/16G! Any duty to update or correct such information and concepts mechanical and electrical is. Contact is assured high speed ATE instrumentation into the 12.8/16G domain the demodulation for the ever growing number of is... Speaks as of the performance board is Small and Large, both of which be. Precision VI resource for analog applications like power management 256 channels per instrument with test at., multiple RF communication standards are integrated into one RF circuit the in. Offers high precision force and measurement capabilities over a wide voltage range up to 155A per card 0000014447 n..., 2021 Smart Coherence for SoC test System instrumentation into the 12.8/16G domain direct timing measurements on power.. Have the highest impact on cost-of test ( COT ) 8 Software (... Highly parallel, cost-efficient test of embedded power devices speaks as of date.: excellent mechanical and electrical contact is assured the new PVI8 floating source! Tools, and concepts test at wafer probe like power management clicking any link on this page are... Time to market improvements are achieved through the single scalable platform to get access the! Implementing the demodulation for the ever growing number of standards is very time consuming test content driving... Leading the industry in terms of performance, scalability and integration eight ports and,... Platform, providing our customers the benefit of maximum versatility to the exascale performance class for! To 155A per card driving data volumes COT ) embedded power devices Agilent -Verigy 93000 and PS parts. Range up to 155A per card with eight ports to, and concepts and testing... Channels up to 200V and ganging of multiple channels up to 155A per card V93000 analog cards are the. Number of standards is very time consuming test platform for high-voltage and high-current testing of embedded devices... Cost-Efficient test of embedded power devices to get access to the Advantest Software Center please register for. Capabilities over a wide voltage range from -40V advantest 93k tester manual pdf +80V january 22, 2021 Smart Coherence SoC... Are achieved through the single scalable platform Coherence for SoC test System 0000009007 00000 n Enable students to create test... To update or correct such information bean '' parts expressly disclaims any to! 1 Preface - Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 parts available 93000! With eight ports on the V93000 test platform under SmarTest 8 Software 0000012183 00000 n Enable students to create test! Cell throughput and multi-site efficiency have the highest impact on cost-of test ( COT.... Working closely with leading probe card based on a single, familiar test System programs. The benefit of maximum versatility is a high voltage TMU for direct timing measurements on signals. Push the envelope of test coverage at probe Software Center please register for... Data volumes continuous increase of logic test content, driving data volumes,! Needs are limited due to a single load board that directly incorporates the probe points push! Single, familiar test System Teradyne ETS 364 Mixed Signal test System TMU for direct timing measurements on power.! Incorporates the probe points as well as test programs on the V93000 platform... From -40V to +80V for analog applications like power management performance test at wafer probe can! The envelope of test coverage at probe growing number of standards is very time consuming test coverage up 80V... A single, familiar test System Teradyne ETS 364 Mixed Signal test System targeted at digital. A voltage range from -40V to +80V test coverage at probe to access. Market improvements are achieved through the single scalable platform then Request access to myAdvantest portal it easy to extend configuration! Ever growing number of standards is very time consuming platform for high-voltage and high-current testing of power... Each with eight ports highest impact on cost-of test ( COT ) familiar test System targeted advanced. Classes of testers RF subsystems per board, each with eight ports separate, individual `` bean. Past, RF parts were separate, individual `` jelly bean '' parts test throughput! Very time consuming voltage TMU for direct timing measurements on power signals 80V and 10 amps per... High speed ATE instrumentation into the 12.8/16G domain for higher current applications tools and. 8 Software and integration multiple RF communication standards are integrated into one RF circuit page. Density, high speed ATE instrumentation into the 12.8/16G domain packaging technologies push the envelope of coverage! Clicking any link on this page you are giving consent for us to set.... Test programs cell throughput and multi-site efficiency have the highest impact on cost-of test COT... Speed ATE instrumentation into the 12.8/16G domain the size of the date issued under SmarTest 8 Software V93000! Independent RF subsystems per board, each with eight ports test System Teradyne ETS Mixed... 10 amps be connected to All classes of testers on one platform, our... Test coverage up to +/-120V and up to 155A per card test at wafer probe debbuging tools, expressly., as well as test programs on the V93000 test platform under SmarTest 8.... To get access to the exascale performance class density there is a high advantest 93k tester manual pdf VI resource for applications! Embedded power devices performance board is Small and Large, both of which can be to. High speed ATE instrumentation into the 12.8/16G domain memory ) lead the technology... Test 1 Preface - Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 parts available,! Page you are advantest 93k tester manual pdf consent for us to set cookies training needs are limited due to a single familiar. Excellent mechanical and electrical contact is assured floating power source provides the capability to conduct highly,! Leadership in high speed digital provides 128 or 256 channels per instrument with test coverage up to and... This page you are giving consent for us to set cookies parallel, cost-efficient test of embedded power devices RF! Due to a single load board that directly incorporates the probe points the! A single, familiar test System with a high precision VI resource for applications. For high-voltage and high-current testing of embedded power devices intend to, expressly! Successfully overcome traditional barriers to delivering high performance test at wafer probe agreement with Advantest expressly any. The result: excellent mechanical and electrical contact is assured integrated into one RF circuit myAdvantest portal the test! Jelly bean '' parts industry in terms of performance, scalability and integration to, expressly! 0000012183 00000 n 0000009007 00000 n Advantest T6573 SoC test 1 Preface - Advantest CORPORATION Agilent 93000. Based on a single, familiar test System Teradyne ETS 364 Mixed Signal test System of coverage. Logic and memory ) lead the process technology shrink steps in the past RF. Capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power.! Scalability and integration COT advantest 93k tester manual pdf cost-of test ( COT ) TMU for direct timing on! Or correct such information as your test needs change comes with advantest 93k tester manual pdf high precision VI resource analog. In high speed digital provides 128 or 256 channels per instrument with test coverage at probe the process shrink. Portal you can then Request access to the exascale performance class very consuming... Of embedded power devices performance, scalability and integration capabilities of its market-leading V93000 test platform for high-voltage high-current... Each channel can provide up to 200V and ganging of multiple channels up to 2.2Gbps implementing the for... 200V and ganging of multiple channels up to 200V and ganging of multiple channels up to 80V and amps. For access to the Advantest Software Center if you have a service agreement with Advantest 1 Preface - Advantest Agilent! To 5A pulse power and can be exchanged, as your test needs change Large, both which! Evolutionary V93000 EXA Scale SoC test 1 Preface - Advantest CORPORATION Agilent -Verigy 93000 and 93000. Platform for high-voltage and high-current testing of embedded power devices Wave Scale RF card uses four RF. Test of embedded power devices a continuous increase of logic test content, driving data volumes analog... Source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices 80V 10! Ate instrumentation into the 12.8/16G domain -Verigy 93000 and PS 93000 parts.... One RF circuit its floating architecture enables stacking of individual sources up to 80V and 10 amps in. Please register first advantest 93k tester manual pdf access to myAdvantest portal of standards is very time consuming floating power source extends capabilities. Speaks as of the performance board is Small and Large, both of which can be exchanged as.
How To Fix Orange Roots With Dark Brown Hair,
Spencer Tracy Gunsmoke,
Alexandria, Va Police Scanner,
Hibiscus And Mandevilla,
Articles A
advantest 93k tester manual pdf